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[IEEE 1997 IEEE International Conference on Microelectronic Test Structures Proceedings - Monterey, CA, USA (17-20 March 1997)] 1997 IEEE International Conference on Microelectronic Test Structures Proceedings - A proposal for modeling substrate coupling in Si-MMICs and its experimental verification up to 40 GHz

✍ Scribed by Pfost, M.; Rein, H.-M.

Book ID: 126597575
Publisher: IEEE
Year: 1997
Weight: 480 KB
Category: Article
ISBN-13: 9780780332430
DOI: 10.1109/ICMTS.1997.589332

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