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[IEEE 11th IEEE International On-Line Testing Symposium - French Riviera, France (2005.07.8-2005.07.8)] 11th IEEE International On-Line Testing Symposium - Autonomous transient fault emulation on FPGAs for accelerating fault grading

✍ Scribed by Lopez-Ongil, C.; Garcia-Valderas, M.; Portela-Garcfa, M.; Entrena-Arrontes, L.

Book ID: 126645810
Publisher: IEEE
Year: 2005
Weight: 169 KB
Category: Article
ISBN-13: 9780769524061
DOI: 10.1109/IOLTS.2005.18

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