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[IEEE 11th IEEE International On-Line Testing Symposium - French Riviera, France (2005.07.8-2005.07.8)] 11th IEEE International On-Line Testing Symposium - Electrical modeling for laser testing with different pulse durations

✍ Scribed by Douin, A.; Pouget, V.; Lewis, D.; Fouillat, P.; Perdu, P.

Book ID: 121755119
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 135 KB
Category: Article
ISBN-13: 9780769524061
DOI: 10.1109/IOLTS.2005.27

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