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[IEEE 11th IEEE International On-Line Testing Symposium - French Riviera, France (2005.07.8-2005.07.8)] 11th IEEE International On-Line Testing Symposium - Design for mitigation of single event effects

✍ Scribed by Nicolaidis, M.

Book ID: 121249457
Publisher: IEEE
Year: 2005
Weight: 46 KB
Category: Article
ISBN-13: 9780769524061
DOI: 10.1109/IOLTS.2005.20

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