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[IEEE 11th IEEE International On-Line Testing Symposium - French Riviera, France (2005.07.8-2005.07.8)] 11th IEEE International On-Line Testing Symposium - Evaluation of SET and SEU effects at multiple abstraction levels

✍ Scribed by Anghel, L.; Leveugle, R.; Vanhauwaert, P.

Book ID: 126607348
Publisher: IEEE
Year: 2005
Weight: 83 KB
Category: Article
ISBN-13: 9780769524061
DOI: 10.1109/IOLTS.2005.28

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