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[IEEE 11th IEEE International On-Line Testing Symposium - French Riviera, France (2005.07.8-2005.07.8)] 11th IEEE International On-Line Testing Symposium - A review of DASIE code family: contribution to SEU/MBU understanding

✍ Scribed by Hubert, G.; Buard, N.; Weulersse, C.; Carriere, T.; Palau, M.-C.; Palau, J.-M.; Lambert, D.; Baggio, J.; Wrobel, F.; Saigne, F.; Gaillard, R.

Book ID: 117998076
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 169 KB
Volume: 0
Category: Article
ISBN-13: 9780769524061
DOI: 10.1109/iolts.2005.12

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