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[IEEE 11th IEEE International On-Line Testing Symposium - French Riviera, France (2005.07.8-2005.07.8)] 11th IEEE International On-Line Testing Symposium - A 32-bit COTS-based fault-tolerant embedded system

✍ Scribed by Amir Rajabzadeh,

Book ID: 120200926
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 68 KB
Category: Article
ISBN-13: 9780769524061
DOI: 10.1109/IOLTS.2005.5

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