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[IEEE 11th IEEE International On-Line Testing Symposium - French Riviera, France (2005.07.8-2005.07.8)] 11th IEEE International On-Line Testing Symposium - Increasing fault tolerance to multiple upsets using digital sigma-delta modulators

✍ Scribed by Schuler, E.; Cairo, L.

Book ID: 120048844
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 110 KB
Category: Article
ISBN-13: 9780769524061
DOI: 10.1109/IOLTS.2005.37

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