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[IEEE 11th IEEE International On-Line Testing Symposium - French Riviera, France (2005.07.8-2005.07.8)] 11th IEEE International On-Line Testing Symposium - Yield Prediction of High Performance Pipelined Circuit with Respect to Delay Failures in Sub-100nm Technology

✍ Scribed by Datta, A.; Mukhopadhyay, S.; Bhunia, S.; Roy, K.

Book ID: 126604341
Publisher: IEEE
Year: 2005
Weight: 855 KB
Category: Article
ISBN-13: 9780769524061
DOI: 10.1109/IOLTS.2005.71

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