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Hot hole stress induced leakage current (SILC) transient in tunnel oxides

✍ Scribed by Tahui Wang; Nian-Kai Zous; Jia-Long Lai; Chimoon Huang

Book ID: 117989494
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 107 KB
Volume: 19
Category: Article
ISSN: 0741-3106
DOI: 10.1109/55.728896

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