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Model of leakage current induced by dynamic stress in thin EEPROM tunnel oxides

✍ Scribed by J.P. Sorbier; S. Croci; B. Imbert; C. Plossu

Book ID: 117146493
Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 227 KB
Volume: 322
Category: Article
ISSN: 0022-3093
DOI: 10.1016/s0022-3093(03)00191-1

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