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Hot-Carrier Reliability of Gate-All-Around MOSFET for RF/Microwave Applications

✍ Scribed by Gautam, Rajni; Saxena, Manoj; Gupta, R. S.; Gupta, Mridula

Book ID: 121272444
Publisher: IEEE
Year: 2013
Tongue: English
Weight: 820 KB
Volume: 13
Category: Article
ISSN: 1530-4388
DOI: 10.1109/TDMR.2012.2237175

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