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Hot-carrier reliability of 20V MOS transistors in 0.13 μm CMOS technology

✍ Scribed by Y. Rey-Tauriac; J. Badoc; B. Reynard; R.A. Bianchi; D. Lachenal; A. Bravaix

Book ID: 108210574
Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 568 KB
Volume: 45
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2005.07.019

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