✦ LIBER ✦
The switch of the worst case on NBTI and hot-carrier reliability for 0.13 μm pMOSFETs
✍ Scribed by Chia-Hao Tu; Shuang-Yuan Chen; Meng-Hong Lin; Mu-Chun Wang; Ssu-Han Wu; Sam chou; Joe Ko; Heng-Sheng Huang
- Book ID
- 104002389
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 822 KB
- Volume
- 254
- Category
- Article
- ISSN
- 0169-4332
No coin nor oath required. For personal study only.