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Hot-carrier-induced degradation in short p-channel nonhydrogenated polysilicon thin-film transistors

✍ Scribed by Hastas, N.A.; Dimitriadis, C.A.; Brini, J.; Kamarinos, G.

Book ID
114616829
Publisher
IEEE
Year
2002
Tongue
English
Weight
275 KB
Volume
49
Category
Article
ISSN
0018-9383

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