✦ LIBER ✦
A Model for Predicting On-Current Degradation Caused by Drain-Avalanche Hot Carriers in Low-Temperature Polysilicon Thin-Film Transistors
✍ Scribed by Kawamura, T.; Matsumura, M.; Kaitoh, T.; Noda, T.; Hatano, M.; Miyazawa, T.; Ohkura, M.
- Book ID
- 114619267
- Publisher
- IEEE
- Year
- 2009
- Tongue
- English
- Weight
- 397 KB
- Volume
- 56
- Category
- Article
- ISSN
- 0018-9383
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