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Hot carrier effects in polycrystalline silicon thin-film transistors: analysis of electrical characteristics and noise performance modifications

✍ Scribed by L Mariucci; A Pecora; S Giovannini; R Carluccio; F Massussi; G Fortunato

Book ID: 108362387
Publisher: Elsevier Science
Year: 1999
Tongue: English
Weight: 666 KB
Volume: 39
Category: Article
ISSN: 0026-2714
DOI: 10.1016/s0026-2714(98)00162-0

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