Effects of hot-carrier stress on high performance polycrystalline silicon thin film transistor with a single perpendicular grain boundary

✍ Scribed by I.H. Song; H.S. Shin; M.K. Han

• Book ID: 108289524
• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 832 KB
• Volume: 515
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/j.tsf.2006.11.053