Performance analysis of polycrystalline silicon thin-film transistor based on a model of depletion layer width modulation at grain boundaries

✍ Scribed by Toshiro Shinohara; Kunihiro Asada; Takuo Sugano

• Book ID: 112078444
• Publisher: John Wiley and Sons
• Year: 1990
• Tongue: English
• Weight: 703 KB
• Volume: 73
• Category: Article
• ISSN: 8756-663X
• DOI: 10.1002/ecjb.4420730712