Carrier mobility measurement across a single grain boundary in polycrystalline silicon using an organic gate thin-film transistor

✍ Scribed by Hashimoto, Masaki; Kanomata, Kensaku; Momiyama, Katsuaki; Kubota, Shigeru; Hirose, Fumihiko

• Book ID: 120405806
• Publisher: American Institute of Physics
• Year: 2012
• Tongue: English
• Weight: 862 KB
• Volume: 100
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.3675863