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Hot-carrier dependent radiation effects in p-channel metal oxide semiconductor field effect transistors

✍ Scribed by N.C. Das; V. Nathan

Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 249 KB
Volume: 37
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(94)90230-5

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