✦ LIBER ✦

Hot-carrier degradation of p-MOSFET's under analog operation

✍ Scribed by Thewes, R.; Brox, M.; Goser, K.F.; Weber, W.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Hot-carrier degradation behavior of N- a

✍ Bellens, R.; Groeseneken, G.; Heremans, P.; Maes, H.E. 📂 Article 📅 1994 🏛 IEEE 🌐 English ⚖ 914 KB

Channel-length-independent hot-carrier d

✍ Thewes, R.; Broz, M.; Tempel, G.; Weber, W.; Goser, K. 📂 Article 📅 1992 🏛 IEEE 🌐 English ⚖ 310 KB

Enhanced hot-carrier-degradation in LDD

✍ Shimoyama, N.; Tsuchiya, T. 📂 Article 📅 1995 🏛 IEEE 🌐 English ⚖ 465 KB

Hot carrier-induced degradation mechanis

✍ T. Ouisse; A.J. Auberton-Hervé; B. Giffard; G. Reimbold 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 261 KB

Gate-oxide thickness dependence of hot-c

✍ Hiroki, A.; Odanaka, S. 📂 Article 📅 1992 🏛 IEEE 🌐 English ⚖ 623 KB

Mechanisms of hot-carrier induced degrad

✍ A. Zaleski; D.E. Ioannou; G.J. Campisi; H.L. Hughes 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 264 KB