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Channel-length-independent hot-carrier degradation in analog p-MOS operation

✍ Scribed by Thewes, R.; Broz, M.; Tempel, G.; Weber, W.; Goser, K.


Book ID
119958547
Publisher
IEEE
Year
1992
Tongue
English
Weight
310 KB
Volume
13
Category
Article
ISSN
0741-3106

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