Hot-carrier degradation of the low-frequency noise in MOS transistors under analog and RF operating conditions

✍ Scribed by Brederlow, R.; Weber, W.; Schmitt-Landsiedel, D.; Thewes, R.

• Book ID: 114616840
• Publisher: IEEE
• Year: 2002
• Tongue: English
• Weight: 320 KB
• Volume: 49
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2002.802640