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Impact of hot-carrier degradation on the low-frequency noise in MOSFETs under steady-state and periodic large-signal excitation
✍ Scribed by Kolhatkar, J.; Hoekstra, E.; Hof, A.; Salm, C.; Schmitz, J.; Wallinga, H.
- Book ID
- 119962132
- Publisher
- IEEE
- Year
- 2005
- Tongue
- English
- Weight
- 113 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0741-3106
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