Hot carrier induced degradation in mesa-isolated n-channel SOI MOSFETs operating in a Bi-MOS mode

✍ Scribed by Ru Huang; Jinyan Wang; Xing Zhang; Yangyuan Wang

• Book ID: 114538765
• Publisher: IEEE
• Year: 2001
• Tongue: English
• Weight: 114 KB
• Volume: 48
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.936565