✦ LIBER ✦
A thorough investigation of the degradation induced by hot-carrier injection in deep submicron N- and P-channel partially and fully depleted unibond and SIMOX MOSFETs
✍ Scribed by Shing-Hwa Renn; Raynaud, C.; Pelloie, J.-L.; Balestra, F.
- Book ID
- 114537452
- Publisher
- IEEE
- Year
- 1998
- Tongue
- English
- Weight
- 262 KB
- Volume
- 45
- Category
- Article
- ISSN
- 0018-9383
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