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Highly conductive diamond probes for scanning spreading resistance microscopy

✍ Scribed by Hantschel, T.; Niedermann, P.; Trenkler, T.; Vandervorst, W.

Book ID: 120079525
Publisher: American Institute of Physics
Year: 2000
Tongue: English
Weight: 554 KB
Volume: 76
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.126109

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