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Fabrication of monolithic diamond probes for scanning probe microscopy applications

โœ Scribed by Mihalcea, C.; Scholz, W.; Malavé, A.; Albert, D.; Kulisch, W.; Oesterschulze, E.

Book ID
113035229
Publisher
Springer
Year
1998
Tongue
English
Weight
73 KB
Volume
66
Category
Article
ISSN
1432-0630

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## Abstract Scanning probe microscopy (SPM) is a widely used experimental technique for characterizing and fabricating nanostructures on surfaces. In particular, due to its ability to spatially map variations in materials properties with nanometer spatial resolution, SPM is particularly well suited