Batch fabricated dual cantilever resistive probe for scanning thermal microscopy

✍ Scribed by Y. Zhang; P.S. Dobson; J.M.R. Weaver

• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 597 KB
• Volume: 88
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/j.mee.2011.02.040