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High work-function metal gate and high-κ dielectrics for charge trap flash memory device applications

✍ Scribed by Sanghun Jeon; Jeong Hee Han; Jung Hoon Lee; Sangmoo Choi; Hyunsang Hwang; Chungwoo Kim


Book ID
114618043
Publisher
IEEE
Year
2005
Tongue
English
Weight
799 KB
Volume
52
Category
Article
ISSN
0018-9383

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