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High-resolution X-ray diffraction investigations of the microstructure of MOVPE grown a-plane AlGaN epilayers

✍ Scribed by Masihhur R. Laskar; Tapas Ganguli; Nirupam Hatui; A.A. Rahman; M.R. Gokhale; Arnab Bhattacharya

Book ID: 108166143
Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 373 KB
Volume: 315
Category: Article
ISSN: 0022-0248
DOI: 10.1016/j.jcrysgro.2010.09.003

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