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High resolution X-ray diffraction studies of CdxHg1-xTe/CdTe epitaxial layers grown by MOVPE on GaAs substrates

✍ Scribed by A.M. Keir; A. Graham; S.J. Barnett; J. Giess; M.G. Astles; S.J.C. Irvine

No coin nor oath required. For personal study only.

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