A combination of high-resolution X-ray diffractometry and diffraction imaging techniques applied to the study of MOVPE-grown CdxHg1−xTe/CdTe on GaAs

✍ Scribed by A.M. Keir; S.J. Barnett; J. Giess; T.D. Walsh; M.G. Astles

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 460 KB
• Volume: 50
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/0169-4332(91)90146-b