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High quality interfaces of InAs-on-insulator field-effect transistors with ZrO2 gate dielectrics

✍ Scribed by Takei, Kuniharu; Kapadia, Rehan; Fang, Hui; Plis, E.; Krishna, Sanjay; Javey, Ali

Book ID: 120226887
Publisher: American Institute of Physics
Year: 2013
Tongue: English
Weight: 915 KB
Volume: 102
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.4802779

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