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Influence of trapping states at the dielectric–dielectric interface on the stability of organic field-effect transistors with bilayer gate dielectric

✍ Scribed by Chengang Feng; Ting Mei; Xiao Hu

Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
592 KB
Volume
12
Category
Article
ISSN
1566-1199

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