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High-performance deep submicron CMOS technologies with polycrystalline-SiGe gates

✍ Scribed by Ponomarev, Y.V.; Stolk, P.A.; Salm, C.; Schmitz, J.; Woerlee, P.H.

Book ID: 114538100
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 244 KB
Volume: 47
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.831003

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