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High-level delay test generation for modular circuits

✍ Scribed by Joonhwan Yi; Hayes, J.P.

Book ID: 111675848
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 826 KB
Volume: 25
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2005.853697

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