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Test generation for sequential circuits using state transition diagram and test generation for combinatorial circuit part

✍ Scribed by Tetsu Hasegawa; Kyoko Miura; Toshiaki Ohmameuda; Hideo Ito

Publisher: John Wiley and Sons
Year: 2001
Tongue: English
Weight: 255 KB
Volume: 84
Category: Article
ISSN: 8756-663X
DOI: 10.1002/ecjb.1046

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