✦ LIBER ✦
Test generation system for digital circuits : Kyouji Tomita, Shigehiro Funatsu, Nobuo Wakatsuki and Akihiko Yamada. NEC Res. Dev.49, 16 (April 1978)
- Publisher
- Elsevier Science
- Year
- 1978
- Tongue
- English
- Weight
- 114 KB
- Volume
- 18
- Category
- Article
- ISSN
- 0026-2714
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