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Mixed level test generation for high fault coverage

✍ Scribed by U. Hübner; H. Hinsen; M. Hofebauer; H.T. Vierhaus

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Test generation at the algorithm-level f

✍ Eduardas Bareisa; Vacius Jusas; Kestutis Motiejunas; Rimantas Seinauskas 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 226 KB

Bounds on population coverage using test

✍ Hassan Farhat; Steve From 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 598 KB

High-level delay test generation for mod

✍ Joonhwan Yi; Hayes, J.P. 📂 Article 📅 2006 🏛 IEEE 🌐 English ⚖ 826 KB

Review of high level fault modeling appr

✍ Likun Xia; Bell Ian; Wilkinson Antony 📂 Article 📅 2010 🏛 SP Science Press 🌐 English ⚖ 177 KB

Stuck fault test generation for dynamic

✍ Asad A. Ismaeel 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 573 KB

RTL-Based Functional Test Generation for

✍ M.B. Santos; F.M. Gonçalves; I.C. Teixeira; J.P. Teixeira 📂 Article 📅 2001 🏛 Springer US 🌐 English ⚖ 268 KB