RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems

✍ Scribed by M.B. Santos; F.M. Gonçalves; I.C. Teixeira; J.P. Teixeira

• Book ID: 110309575
• Publisher: Springer US
• Year: 2001
• Tongue: English
• Weight: 268 KB
• Volume: 17
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1023/a:1012223614418