RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage

✍ Scribed by M.B. Santos; F.M. Gonçalves; I.C. Teixeira; J.P. Teixeira

• Book ID: 110332798
• Publisher: Springer US
• Year: 2002
• Tongue: English
• Weight: 308 KB
• Volume: 18
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1023/a:1014997610714