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Functional versus random test generation for sequential circuits

✍ Scribed by Margot Karam; Gabriele Saucier

Publisher
Springer US
Year
1993
Tongue
English
Weight
691 KB
Volume
4
Category
Article
ISSN
0923-8174

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πŸ“œ SIMILAR VOLUMES

Sequential circuit test generation by re
Sequential circuit test generation by real number simulation
✍ Kazunori Hikone; Mitsuji Ikeda; Kazumi Hatayama; Terumine Hayashi πŸ“‚ Article πŸ“… 1993 πŸ› John Wiley and Sons 🌐 English βš– 921 KB

## Abstract This paper presents a test generation method using an optimization technique for a single stuck‐at fault in synchronous sequential circuits. This method utilizes a new real number simulation for defining the cost of an input pattern for a given fault and leads an input pattern to a test

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In this article a method is presented for evaluating the probability of detecting (PD) a single stuck-fault in a sequential circuit as a function of the number of random input test vectors. A discrete parameter Markovmodel is used in the analysis to obtain closed-form expressions for PD. The circuit