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The probability of error detection in sequential circuits using random test vectors

✍ Scribed by Asad A. Ismaeel; Melvin A. Breuer

Publisher: Springer US
Year: 1991
Tongue: English
Weight: 836 KB
Volume: 1
Category: Article
ISSN: 0923-8174
DOI: 10.1007/bf00136314

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✦ Synopsis

In this article a method is presented for evaluating the probability of detecting (PD) a single stuck-fault in a sequential circuit as a function of the number of random input test vectors. A discrete parameter Markovmodel is used in the analysis to obtain closed-form expressions for PD. The circuit is partitioned into three parts, the input and output combinational logic and the memory. The analysis is based upon the stationary-state transition matrix associated with a circuit, and the probability that a fault in one of the partitions produces an error at the output of that partition when a random input vector is applied. Results are presented to show how this problem can be reduced to that of testing an equivalent combinational circuit.

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