๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

High frequency channel noise measurement and characterization in deep submicron MOSFETs

โœ Scribed by A. Allam; I. M. Filanovsky


Publisher
Springer
Year
2010
Tongue
English
Weight
823 KB
Volume
65
Category
Article
ISSN
0925-1030

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES