Measurements of interface state density in partially- and fully-depleted silicon-on-insulator MOSFETs by a high-low-frequency transconductance method

✍ Scribed by P.C. Yang; H.S. Chen; Sheng S. Li

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 306 KB
• Volume: 35
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(92)90001-s