Measurements of interface state density in partially- and fully-depleted silicon-on-insulator MOSFETs by a high-low-frequency transconductance method : P. C. Yang, H. S. Chen and Sheng S. Li. Solid-State Electronics35(8), 1031 (1992)

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 105 KB
• Volume: 33
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(93)90228-q