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Growth pressure dependence of residual strain and threading dislocations in the GaN layer

✍ Scribed by Sung-Nam Lee; J. K. Son; H. S. Paek; T. Sakong; W. Lee; K. H. Kim; S. S. Kim; Y. J. Lee; D. Y. Noh; E. Yoon; O. H. Nam; Y. Park

Publisher: John Wiley and Sons
Year: 2004
Tongue: English
Weight: 193 KB
Volume: 1
Category: Article
ISSN: 1862-6351
DOI: 10.1002/pssc.200405007

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