Strain Relaxation in GaN Films as a Function of Growth Direction and Buffer Layer Measured by Raman Spectroscopy

✍ Scribed by Seitz, R. ;Monteiro, T. ;Pereira, E. ;Di Forte-Poisson, M.

• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 130 KB
• Volume: 176
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/(sici)1521-396x(199911)176:1<661::aid-pssa661>3.0.co;2-i